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GETec Microscopy - the leading solution for AFM in SEM

18 September 2018

AFSEM™ lets you simultaneously image your sample with high resolution, create true 3D-topography representations, and accurately measure heights, distances and even material properties, all while maintaining the large SEM field of view to position your AFSEM™ cantilever exactly where you want it.

 

  • In situ AFM analysis in your SEM
  • Correlative AFM and SEM analysis
  • Compatible with most SEMs without impeding normal operation
  • Many analysis techniques in parallel to AFM and SEM
  • Intuitive handling with SCL's self-sensing cantilever technology

Combine two of the most powerful analysis techniques available - discover more!

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